Job Description
THE ROLE:
Be a member of the team that plays a significant role in ensuring the quality of next generation microprocessors through structured DFT, Automatic Test Pattern Generation (ATPG) and Logic Built-In Self-Test (LBIST) techniques.
Key responsibilities:
Collaborating with the design teams to ensure DFT design rules and guidelines are met
- The person should have experience in timing concepts
- Generating high quality manufacturing test patterns for stuck-at, transition fault models and through the use of on-chip test compression techniques
- Exercising the LBIST circuitry and ensuring that repeatable signatures can be produced
- Simulating and verifying the ATPG and LBIST patterns
- Working with the product engineering teams on the delivery of manufacturing test patterns
- Developing, improving and maintaining scripts as vital
Desired profile - The candidate must have detailed knowledge of DFT basics such as scan insertion, fault models, ATPG, BIST techniques, and on-chip compression techniques that reduce test time and tester memory. Experience with test tools such as FastScan and TestKompress is highly desirable.Scan/ATPG, knowledge of industry standard DFT features, simulation debug, MBIST
Academic credentials:
- MS/M Tech/BE in Computer Engineering/Electronics/Electrical Engineering
- Demonstrated success in a senior IC team role with similar skills
Location:
Hyderabad Telangana
